GREEN OPTICS

Measuring Equipment Specifications

Capabilities: Flat, cylindrical, and curvature measurement (CX ≤ 700, CC ≤ 1000)
RMS Simple Repeatability: < 0.06 nm, λ/10,000 (2σ)
RMS Wavefront Repeatability: < 0.35 nm, λ/1,800 (mean + 2σ)
Peak Pixel Deviation: < 0.5 nm, λ/1,200 (99.5%)
Pupil Focus Range: 4 inches

Measurement Capabilities:
Parallelism, floor plan, squareness, and roundness
Resolution:
- Standard: 0.5 μm
- High Accuracy: 0.1 μm
Maximum Permissible:
- Standard: 3.5 + L/300, 3.5
- High Accuracy: 3.0 + L/300, 3.0

Angle Measurement:
- Electronic Autocollimator: EFL 300 mm, Diameter 57 mm
- Accuracy:
Resolution: 0.01
Repeatability: ±0.1

Measurement Capabilities: Transmittance, reflectance (absolute reflection), and absorbance
Wavelength Range: 190 ~ 2800 nm / 250 ~ 2500 nm (with Auto Polarizer)
Transmittance Measurement Angle: 0 to 85 degrees
Reflectivity Measurement Angle: 5 to 85 degrees
Measurement Error: < 0.1% (based on 10 repetitions)

Measurement Capabilities: Plane, aspherical surface, cylinder, shape, and roughness
Probe Measurement Range:
- (1) 13 mm (100 mm probe arm) - (2) 26 mm (200 mm probe arm)
Drive X-Axis Uncertainty: ±0.2*L/1000 μm
Measurement Time: 5 ~ 10 minutes
Measuring Range / Resolution (Z-axis): 13 mm / 0.8 nm
Measuring Range / Resolution (X-axis): 0.1-260 mm / 0.8 nm
Minimum Measuring Distance (X-axis): 0.05-30 μm
Positioning Accuracy: 0.1 μm

Measurement Capabilities: Plane, aspherical surface, and curvature (CX550 / CX700)
Repeatability: ≤ 10 nm (λ/60) rms
Reproducibility: ≤ 20 nm (λ/30) rms
Accuracy: ≤ 30 nm (λ/20) rms
Maximum Diameter Measured: ≤ 300 mm